Volume-3 ~ Issue-1
- Citation
- Abstract
- Reference
| Paper Type | : | Research Paper |
| Title | : | Modifying the Scan Chains in Sequential Circuit to Reduce Leakage Current |
| Country | : | India |
| Authors | : | D. Vijayalakshmi, Dr. P. C. Kishore Raja |
| : | 10.9790/4200-0310109 ![]() |
|
ABSTRACT:Our method uses the built-in scan-chain in a VLSI circuit to drive it with the minimum leakage vector when it enters the sleep mode. Using these scan registers eliminates the area and delay overhead of the additional circuitry that would otherwise be needed to apply the minimum leakage vector to the circuit. We show how the proposed technique can be used for several different scan-chain architectures and present the experimental results on the MCNC91 benchmark circuits. General Terms- CMOS VLSI, sub-threshold, Leakage current
Keywords: Scan-in, Scan-out, Scan-chain structure
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- Citation
- Abstract
- Reference
ABSTRACT:Text in images provides essential information of the image content and thus text detection is fundamental to indexing of an image database. The existing methods do not provide effective results for images with different text orientation and text sizes. This paper presents an edge based algorithm that uses connected component analysis for handling non-horizontal text strings and Gaussian scale space for multi-scale texts. The experimental results show the effectiveness of this approach in detecting text blocks irrespective of its orientation and size.
Keywords: Text detection, Text orientation, Text size, connected component analysis, Gaussian scale space
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