IOSR-JAP   Volume-8 ~ Issue-5 ~ Sep-Oct 2016

ABSTRACT: (CdO)1-x(NiO)x thin films have been deposited at annealing temperature (732K) with different concentration of NiO of x=( 0.01, 0.03 and 0.05)Wt% onto glass substrates by using pulsed laser deposition technique Nd-YAG laser with λ =1064nm , energy =500 mJ and number of shots = 500. the X-ray diffraction (XRD) results reveals that the characteriste deposited(CdO)(NiO)thin films polycrystalline was cubic structure and many peaks (111), (20 0),and (220) with disappear the peak of NiO, The results it was calculated show that the UV emission is at a constant peak position in the spectra.

Keywords:: (CdO)1-x(NiO)x Thin Film; structural properties; pulse laser deposition technique; optical properties and electrical properties

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ABSTRACT: Single crystals of pure and picric acid doped thiourea were grown by slow evaporation technique. Single crystal structure was determined by X-ray diffraction data and it reveals that the crystal belongs to orthorhombic crystal system with space group of Pnma. The dielectric constant and dielectric loss were calculated by varying frequencies at different temperatureThemicrohardness test reveals that the crystals possessvery good mechanical strength. Vibration spectrum reveals the symmetries of molecular vibrations

Keywords: Slow evaporation technique, dielectric studies, mechanical strength etc

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ABSTRACT: ZnO/SnO2 thin films with different percentage (1:1,1:2,2:1) were deposited on a glass substrate by Spray Pyrolysis technique using solution of zinc acetate ,tin chloride and air as the carrier gas at 400 °C temperature. The structural properties of the composite films are investigated by x-ray diffraction andAFM. The optical spectra of the films were measured in the wavelength range of 300 –1100nm by UV-VIS Spectrometer device.Optical constants such as Absorption coefficient α, refractive index n , extinction coefficient k and dielectric constant were determined from transmittance spectrum in the UV-VIS regions. The films were found to exhibit high transmittance inthe visible regions. The energy band gapof the films were evaluated as 3.85,3.70,3.70,3.85 and 3.60 eV for ZnO pure,SnO2 pure and the percentage (1:1,1:2,2:1) of ZnO:SnO2 respectively.

Keywords: Metal-oxides , Morphological structures,Dopant elements,spray pyrolysis ,Optical properties ,Structural properties .

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ABSTRACT: Evaluated Nuclear Data Files (ENDF) can be used for neutronic analysis of thermal reactor such as research reactor. JENDL-4.0u (Japanese Evaluated Nuclear Data Library) is released by JAEA to read in ENDF-6 format. The aim of this analysis is to validate the nuclear data files of JENDL-4.0u for neutronics calculation of 3-MW TRIGA MARK-II research reactor through the analysis of integral parameters of TRX (Thermal Reactor-one region lattice) and BAPL (Bettis Atomic Power Laboratory-one region lattice) benchmark lattices of thermal reactor..............

Keywords: BAPL, JENDL-4.0u, NJOY99.0, TRIGA MARK-II, TRX and WIMSD-5B

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